Ferdeghini C., Eisterer M., Vaglio R., Putti M., Bernini C., Calatroni S., Bellingeri E., Holleis S., Bernardi J., Leveratto A., Saba A., Himmerlich M., Henrist B., Fernandez-Pena S., Moros A.
Malagoli A., Ferdeghini C., Mancini A., Vannozzi A., Celentano G., Braccini V., Putti M., Manfrinetti P., Pallecchi I., Bernini C., Bellingeri E., Leveratto A., Sylva G., Lisitskiy M., Manca N., Provino A.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
Malagoli A., Ferdeghini C., Vannozzi A., Celentano G., Hopkins S.C., Braccini V., Putti M., Ballarino A., Bellingeri E., Sylva G., Lunt A.
Ключевые слова: FeSeTe, coated conductors, substrate metallic, texture, X-ray diffraction, microstructure, composition, distribution, fabrication, experimental results
Ferdeghini C., Braccini V., Putti M., Ghigo G., Gozzelino L., Pallecchi I., Pace S., Grimaldi G., Leo A., Nigro A., Martinelli A., Bellingeri E., Torsello D., Sylva G., Pellegrino L.
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Ferdeghini C., Braccini V., Pace S., Guarino A., Grimaldi G., Leo A., Nigro A., Bellingeri E., Avitabile F., Marra P., Citro R.
Ключевые слова: MgB2, wires, fabrication, ex-situ process, PIT process, microstructure, magnetization, critical caracteristics, Jc/B curves, grain size
Ferdeghini C., Braccini V., Sarnelli E., Bellingeri E., Kawale S., Buzio R., Gerbi A., Adamo M., Nappi C.
Ferdeghini C., Holzapfel B., Braccini V., Tarantini C., Putti M., Sarnelli E., Reich E., Bellingeri E., Sala A., Kawale S., Buzio R., Gerbi A., Adamo M.
Ключевые слова: chalcogenide, thin films, PLD process, substrate LaAlO3, substrate SrTiO3, substrate single crystal, substrates, critical temperature, fabrication, microstructure, lattice parameter, critical caracteristics, Jc/B curves, anisotropy, comparison, YBCO, grain boundaries, resistive transition, magnetic field dependence, upper critical fields, high field magnets
Siri A.S., Vignolo M., Bernini C., Romano G., Bellingeri E., Bovone G., Buscaglia M.T., Buscaglia V.
Ferdeghini C., Braccini V., Putti M., Pallecchi I., Guarino A., Grimaldi G., Leo A., Nigro A., Bellingeri E., Kawale S.
Malagoli A., Ferdeghini C., Braccini V., Vignolo M., Nardelli D., Bernini C., Romano G., Martinelli A., Bellingeri E., Bitchkov A.
Ключевые слова: MgB2, fabrication, sintering, phase separation, measurement technique
Jia Y., Wen H.H., Lee S., Eom C.B., Putti M., Pallecchi I., Bellingeri E., Tropeano M., Ferdeghini C., Palenzona A., Tarantini C., Yamamoto A., Jiang J., Jaroszynski J., Kametani F., Abraimov D., Polyanskii A., DWeiss J., EHellstrom E., Gurevich A., Larbalestier D.C., Jin R., Sales B.C., Sefat S.A., McGuire M.A., Mandrus D., Cheng P.
Putti M., Pallecchi I., Bellingeri E., Cimberle M.R., Tropeano M., Ferdeghini C., Palenzona A., Tarantini C., Yamamoto A., Jiang J., Jaroszynski J., Kametani F., Abraimov D., Polyanskii A., Weiss J.D., Hellstrom E.E., Gurevich A., Larbalestier D.C., Jin R., Sales B.C., Sefat A.S., McGuire M.A., Mandrus D., Cheng P., Jia Y., Wen H.H., Lee S., Eom C.B.
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